Reference standard and method for calibration
US7057164B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 11, 2003 |
| Grant date | Jun 6, 2006 |
| Priority date | — |
| Expiry date | Jun 20, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/278
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides a reference standard for calibration of an analysis instrument. The reference standard comprises a solid body formed of a number of compounds and a substrate having scattering properties similar to a product to be analyzed with said analysis instrument and being spectrally neutral in a wavelength range to be used in the analysis instrument. The substrate and the compounds in combination with respect to intensity, wavelength and scattering properties imitate the spectral response of the product to be analyzed with said analysis instrument. The present invention also provides a method for calibration of an analysis instrument, which method comprises recording, by means of said analysis instrument, the spectral response of a reference standard comprising a solid body, which with respect to intensity, wavelength and scattering properties imitates the spectral response of a product to be analyzed with said analysis instrument; evaluating the differences between the response from said analysis instrument and an expected spectral response; and calibrating said analysis instrument according to the result of the evaluation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.