Patent · US Expired

Wide field method for detecting pathogenic microorganisms

US7057721B2 · kind B2 · utility

37Cited by
24References
45Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 27, 2003
Grant dateJun 6, 2006
Priority date
Expiry dateApr 19, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/0221
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Pathogenic microorganisms are detected in a wide field of view and classified by Raman light scattered light from these organisms together with digital pattern recognition of their spectral patterns.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.