Patent · US Expired

Apparatus and method for direct measurement of absorption and scattering coefficients in situ

US7057730B2 · kind B2 · utility

1Cited by
4References
31Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 17, 2003
Grant dateJun 6, 2006
Priority date
Expiry dateNov 11, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/0634
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus for measuring an absorption coefficient includes a first diffusive material, a second diffusive material inside the first diffusive material separated from the first diffusive material by a cavity, and a transparent material proximate to an inner surface of the second diffusive material that holds an absorptive material. First and second light detectors measure light intensities in the first and second diffusive materials respectively. An absorption coefficient for the absorptive material may be determined based on the first and second light intensities measured when the cavity is illuminated by a light source.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.