Method for measuring the optical and physical thickness of optically transparent objects
US7057735B2 · kind B2 · utility
6Cited by
5References
1Claims
0Family size
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Key dates
| Filing date | Nov 6, 2003 |
| Grant date | Jun 6, 2006 |
| Priority date | — |
| Expiry date | Jul 19, 2024 |
Classification
- Technology area (CPC C)Chemistry; Metallurgy
- CPC primaryC03B2207/70
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for measuring the optical thickness and absolute physical thickness of an optically transparent object utilizes a reflective interferometric process. A broadband optical signal is directed toward the object to be measured, and a pair of signals reflected off of the object are processed to determine the optical thickness of the object. When used with an optical fiber preform, the technique can be used to measure the outer diameter of the preform and control the drawing process. If the index of refraction of optically transparent object is known, the absolute physical thickness can also be determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.