Methods and devices for quantitative analysis of x-ray images
US7058159B2 · kind B2 · utility
83Cited by
23References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 6, 2005 |
| Grant date | Jun 6, 2006 |
| Priority date | — |
| Expiry date | Jun 6, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V40/155
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to networked enabled analysis of x-ray images. Also described are devices comprising calibration phantoms; methods of using these devices; methods of formulating databases containing information regarding x-ray images; the databases themselves; and methods of manipulating the information and databases.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.