Method and apparatus for application specific test of PLDs
US7058534B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 19, 2003 |
| Grant date | Jun 6, 2006 |
| Priority date | — |
| Expiry date | Jul 11, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318516
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Method and apparatus for application specific testing of PLDs. The PLD has a number of resources, less than all of which are used for implementing a customer application. The method includes the following steps. The set of resources that is used for implementing the customer application is identified. A test is then performed only on the set and a test result is generated. Defective resources may be replaced. The PLD is identified as defective only if one of the resources associated with the customer application is defective. Such application specific testing allows the ability of the customer to perform in-system testing, the reduction of the time required for testing the PLD, and the testing of PLDs based on knowledge of the customer's application, among other advantages.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.