Patent · US Expired

System for estimating the temporal validity of location reports through pattern analysis

US7058668B2 · kind B2 · utility

1Cited by
3References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 11, 2002
Grant dateJun 6, 2006
Priority date
Expiry dateOct 25, 2023

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S707/99954
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Analysis of a history of previous location reports received from a tracked entity is performed and this analysis is utilized to estimate the relevance of future location reports over time. This is accomplished via associating a computed expiration time with each location report, wherein this expiration time is used by an application to estimate the relevance degradation of a location report over time. Thus, the expiration time value acts as a threshold that controls the shape of a relevance degradation curve of a location report.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.