Patent · US Expired

Method and apparatus for measuring electrochemical corrosion potential inside small shallow cracks

US7060177B2 · kind B2 · utility

3Cited by
5References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 28, 2003
Grant dateJun 13, 2006
Priority date
Expiry dateNov 29, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N17/02
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of measuring an electrochemical corrosion potential (ECP) of a material specimen using a detecting device including an ECP detecting array is provided. The method includes locating an offset spacer in close contact to a face of the ECP detecting array, locating the material specimen within the detecting device with a measurement face in close contact to the offset spacer, establishing a flow through the detecting device, and measuring an electrical potential between the detecting device ground and an electrode wire.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.