Patent · US Expired

Photonic integrated circuit based planar wavelength meter

US7061610B2 · kind B2 · utility

12Cited by
3References
66Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 14, 2003
Grant dateJun 13, 2006
Priority date
Expiry dateDec 20, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J9/0246
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and device for measuring the wavelength of a source, for example monitoring a laser used in DWDM fiber optic communications systems, wherein the method and device comprise using a coarse arrayed waveguide grating (AWG) to resolve an ambiguity of wavelength measurement in a fine arrayed waveguide grating. The wavelength monitor or meter of the present invention may be configured as a standalone device suitable for use in many different applications and may also be integrated into a laser or laser array for use in DWDM fiber optic communications systems.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.