Photonic integrated circuit based planar wavelength meter
US7061610B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 14, 2003 |
| Grant date | Jun 13, 2006 |
| Priority date | — |
| Expiry date | Dec 20, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J9/0246
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and device for measuring the wavelength of a source, for example monitoring a laser used in DWDM fiber optic communications systems, wherein the method and device comprise using a coarse arrayed waveguide grating (AWG) to resolve an ambiguity of wavelength measurement in a fine arrayed waveguide grating. The wavelength monitor or meter of the present invention may be configured as a standalone device suitable for use in many different applications and may also be integrated into a laser or laser array for use in DWDM fiber optic communications systems.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.