Method and apparatus for obtaining simultaneously absorption and refraction images by use of a monochromator with integrated radiation detector
US7062015B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 28, 2002 |
| Grant date | Jun 13, 2006 |
| Priority date | — |
| Expiry date | Oct 28, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/20008
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for imaging an object (13) irradiated with an X-ray beam (12) by detecting a transmitted X-ray beam transmitted through the object. A crystal analyser (15) receives the transmitted X-ray beam and emits a first diffracted X-ray beam to a detector assembly (14) comprising first and second X-ray detectors (16 and 17). The first detector (16) is a monochromating semiconductor detector which detects a first portion of the first diffracted X-ray beam to generate first image data, and which diffracts a second portion of the first diffracted beam to the second detector (17) which generates second image data. Image processing means (18) are provided for combining the first and second image data to derive a refraction image and an absorption image of the object (13).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.