Dielectrophoretic particle profiling system and method
US7063777B2 · kind B2 · utility
1Cited by
12References
53Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 12, 2002 |
| Grant date | Jun 20, 2006 |
| Priority date | — |
| Expiry date | Mar 4, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/1027
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and methods for determining the dielectrophoretic response of particles under various chemical and physical conditions are disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.