High spatial resoulution imaging and modification of structures
US7064824B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 22, 2003 |
| Grant date | Jun 20, 2006 |
| Priority date | — |
| Expiry date | Oct 23, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B7/2467
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a method of high spatial resolution imaging or modifying a structure, the structure is marked with a substance which is selected from the group of substances which can be transferred from a first state having first optical properties to a second state having second optical properties by means of an optical switch over signal. Then, the second state of the substance is adjusted with the switch over signal except for a spatially limited area. If the substance and the switch over signal are adapted to each other in such a way, that everywhere where the switch over signal exceeds a threshold value essentially the second state of the substance is adjusted, and if the spatial area purposefully omitted by the switch over signal is an intensity minimum of an interference pattern, the spatial area of the structure in which the substance is within the first state becomes smaller than the diffraction limit for the switch over signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.