Method and system to inspect a component
US7065176B2 · kind B2 · utility
9Cited by
5References
32Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 28, 2003 |
| Grant date | Jun 20, 2006 |
| Priority date | — |
| Expiry date | Oct 12, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method to inspect a component is disclosed. The system to inspect a component may include an x-ray source to direct an x-ray beam through the component and an x-ray detector to detect the x-ray beam after passing through the component. A processor may be included to transform coordinates on an x-ray detection panel of the x-ray detector that detect any defects to a digital representation of locations on the component of any defects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.