Patent · US Expired

Defect tracking by utilizing real-time counters in network computing environments

US7065723B2 · kind B2 · utility

1Cited by

6References

20Claims

0Family size

Assignee

Sun Microsystems Inc. · US

Inventors

Trung Tran · Round Rock, US
Sze Tom · Austin, US
Alan Folta · Austin, US

Key dates

Filing date	Sep 25, 2002
Grant date	Jun 20, 2006
Priority date	—
Expiry date	Jan 14, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/2247
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Disclosed are novel methods and apparatus for manipulating and generating a real-time counter in network computing environments. In an embodiment, a method of tracking a defect is disclosed. The method includes providing a defect abstract, the defect abstract including information to identify the defect; identifying a component having the defect; assigning a user to resolve the defect; and assigning a defect number to identify the defect, the defect number obtained by incrementing a counter value stored in a file, the file being accessible by a single user at a time.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.