Patent · US Expired

Method for placing electrostatic discharge clamps within integrated circuit devices

US7065728B2 · kind B2 · utility

4Cited by
6References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 29, 2004
Grant dateJun 20, 2006
Priority date
Expiry dateOct 29, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/392
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for placing electrostatic discharge clamps within integrated circuit devices is disclosed. A region is initially defined within an integrated circuit design. A list of ESD-susceptible circuits located within the defined region is then generated. The center of gravity of the ESD-susceptible circuits located within the defined region is located. Next, an ESD protection device is placed at the center of gravity of the ESD-susceptible circuits located within the defined region. A determination is made as to whether or not all ESD-susceptible circuits within the list of ESD-susceptible circuits are protected by the placement of the ESD protection device. If so, the process is repeated in other regions until the entire integrated circuit is addressed. Otherwise, the defined region is divided into at least two smaller regions and the process is repeated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.