Method for measuring the concentration of impurities in nitrogen, hydrogen and oxygen by ion mobility spectrometry
US7067800B2 · kind B2 · utility
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Key dates
| Filing date | Jun 9, 2003 |
| Grant date | Jun 27, 2006 |
| Priority date | — |
| Expiry date | Jul 2, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/622
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for the quantitative analysis of the impurities content in nitrogen, hydrogen or oxygen by means of ion mobility spectrometry is described. The method involves using pure argon or a mixture, having no impurities, containing argon and the gas to be analyzed, as a counterflow gas in the separation zone of the ion mobility spectrometer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.