Patent · US Expired

Method for measuring the concentration of impurities in nitrogen, hydrogen and oxygen by ion mobility spectrometry

US7067800B2 · kind B2 · utility

0Cited by
4References
3Claims
0Family size

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Key dates

Filing dateJun 9, 2003
Grant dateJun 27, 2006
Priority date
Expiry dateJul 2, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N27/622
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for the quantitative analysis of the impurities content in nitrogen, hydrogen or oxygen by means of ion mobility spectrometry is described. The method involves using pure argon or a mixture, having no impurities, containing argon and the gas to be analyzed, as a counterflow gas in the separation zone of the ion mobility spectrometer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.