Multi-component analyzing apparatus
US7071470B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 11, 2003 |
| Grant date | Jul 4, 2006 |
| Priority date | — |
| Expiry date | Mar 8, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/3504
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A multi-component analyzing apparatus in which infrared light is irradiated to a measuring-subject sample S which is constituted by either measuring-subject components whose sorts or quantities are limited or by a mixed article made of said measuring-subject components; intensity of infrared light having respective wavelength ranges which are fitted to infrared absorption spectra of the respective measuring-subject components among such infrared light penetrated through the measuring-subject sample S is measured by employing a plurality of detectors 4a to 4g corresponding thereto; and said multi-component analyzing apparatus is comprised of a calculation processing unit 6 for analyzing the infrared light intensity of the respective wavelength ranges so as to acquire concentration x1 to x7 of the respective measuring-subject components; wherein the calculation processing unit 6 is capable of executing an analyzing process program P for executing analysis operations of the concentration x1 to x7 of the respective measuring-subject components by solving simultaneous equations which are constituted by equations having mutual interference correction terms used to correct interference ad…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.