Enhanced test and measurement instruments using compression and decompression
US7071852B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 13, 2004 |
| Grant date | Jul 4, 2006 |
| Priority date | — |
| Expiry date | Feb 13, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R13/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An enhancement that improves the performance of test and measurement equipment such as digital oscilloscopes and arbitrary waveform generators through the use of compression and decompression is described. The present invention is particularly effective for compressing and decompressing high-speed, bandlimited analog signals that are not appropriately or cannot effectively be compressed by prior art speech, audio, image, and video compression algorithms due to various limitations of such prior art compression solutions. The present invention improves digital oscilloscopes by compressing the sampled version of an analog waveform under observation in real time, allowing a significantly longer duration of the waveform to be stored in the oscilloscope's capture memory, when compared with the duration of the same signal's uncompressed waveform stored in the same memory. Similarly, the present invention improves arbitrary waveform generators by storing a compressed version of a desired arbitrary waveform, instead of the uncompressed version of the arbitrary waveform, in the signal generator's waveform memory. During signal generation, the compressed waveform is decompressed in real time.…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.