Method of defining deviations of pixel positions
US7072505B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 28, 2001 |
| Grant date | Jul 4, 2006 |
| Priority date | — |
| Expiry date | Aug 17, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F39/15
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method of defining deviations from a desired position of pixel sites in an image recording matrix by defining the 3-D data of a planar or slightly curved surface. To the extent necessary the results are smoothed, and the measuring points, utilizing the 3-D data, are projected back the sensors of the image recording matrix for determining the difference between the two points projected onto the sensors and associated with a 3-D measuring point. After selectively shifting the surface relative to the 3-D measuring system, prior method steps are repeated until the desired accuracy in the definition of the deviation has been has been attained.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.