Non-additive measures and metric calculation
US7072897B2 · kind B2 · utility
8Cited by
39References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 27, 2001 |
| Grant date | Jul 4, 2006 |
| Priority date | — |
| Expiry date | May 4, 2024 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S707/99942
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is a system, method, and apparatus for calculating metrics by using hierarchical level metadata to describe the various structures within the database. The hierarchical level metadata permit calculation of complex metrics by an analytical server which would otherwise be difficult or impossible. As a result of the way that the analytical server calculates the metrics, slicing and drilling are supported. Additionally, dimension and fact level security are also supported.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.