Photothermal imaging scanning microscopy
US7075058B2 · kind B2 · utility
18Cited by
6References
30Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 28, 2003 |
| Grant date | Jul 11, 2006 |
| Priority date | — |
| Expiry date | Feb 22, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/171
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Photothermal Imaging Scanning Microscopy produces a rapid, thermal-based, non-destructive characterization apparatus. Also, a photothermal characterization method of surface and subsurface features includes micron and nanoscale spatial resolution of meter-sized optical materials.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.