Patent · US Expired

Semiconductor device and method for fabricating the same

US7075113B2 · kind B2 · utility

4Cited by
3References
4Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 7, 2003
Grant dateJul 11, 2006
Priority date
Expiry dateFeb 10, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10H20/824

Abstract

A light-emitting device and method for fabricating the same are revealed. The light-emitting device includes an epitaxial structure, a P-type ohmic contact electrode and an N-type ohmic contact electrode. The epitaxial structure includes a plurality of epitaxial layers capable of emitting light and P-type contact layer. The P-type ohmic contact electrode includes a first nickel layer deposited on the epitaxial structure, a first platinum layer deposited on the first nickel layer, and a first gold layer deposited on the first platinum layer. According to the fabricating method of the light-emitting device, an epitaxial structure is first formed on the surface of a substrate, a P-type ohmic contact electrode is then formed on the epitaxial structure, and an N-type ohmic contact electrode is formed on the other surface of the substrate. Finally, an annealing process is performed at a temperature between 220° C. and 330° C.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.