System and method to locate an anomaly of a conductor
US7075309B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 7, 2005 |
| Grant date | Jul 11, 2006 |
| Priority date | — |
| Expiry date | Mar 7, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/11
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system (20) and method to locate an anomaly (22) of a conductor (24) is provided. The system (20) uses a test set (28) to inject a test signal (36) into the conductor (24) at a location (PT) and a probe (30) to detect the test signal (36) at a second location (PP). A communication link (42) between the probe (30) and the test set (28) has a predetermined propagation delay (DS), from which the system (20) can calculate a propagation delay (DTP) of the conductor (24) between the test set (28) and the probe (30), and a propagation delay (DPA) between the probe (30) and the anomaly (22). By varying the location (PP) of the probe (30) until the propagation delay (DPA) between the probe (30) and the anomaly (22) is substantially zero, the precise location (PA) of the anomaly (22) may be determined. The propagation velocity (VC) of the conductor (24) may also be determined. The physical distance (LPA) between the probe (30) and the anomaly (22), and hence the precise location (PA) of the anomaly (22), again may be determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.