Double-sampled, time-interleaved analog to digital converter
US7075471B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 11, 2005 |
| Grant date | Jul 11, 2006 |
| Priority date | — |
| Expiry date | Feb 11, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/1215
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
An apparatus and method for high-speed analog to digital conversion are disclosed. An ADC system includes a plurality of N/2 sub-ADCs, each sub-ADC receiving an analog signal and a clock signal and generating two digital samples at a rate of Fs/N. The two digital samples are generated with approximately 180 degree phase relationship relative to a frequency of Fs/N. The plurality of N/2 sub-ADCs of the time-interleaved ADC system, generate combined output samples at a rate of Fs. An ADC method includes a plurality of N/2 sub-ADCs receiving the analog signal, clocking each sub-ADC at a rate of FS/N. Each sub-ADC generates two digital samples at a rate of FS/(2N), the two digital samples being generated with approximately 180 degree phase relationship relative to a frequency of Fs/N. Outputs of the sub-ADCs are combined to generate digital samples at a rate of Fs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.