Biosensor with an arbitrary substrate that can be characterized in photothermal deflection
US7075641B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 16, 2003 |
| Grant date | Jul 11, 2006 |
| Priority date | — |
| Expiry date | Oct 28, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/171
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a sample support designed to support a sample which is to be detected and/or analyzed by a photothermal detection method using an irradiation pump beam irradiating the sample and a detection and/or analysis probe beam. It comprises a substrate supporting a stack of thin dielectric layers forming a Bragg mirror on which the sample will be supported, the stack of thin dielectric layers being used to reflect the pump beam that reaches it.The invention also relates to a device for detection and/or analysis of a sample by a photothermal method, the said device comprising a sample support according to the invention, a means of lighting the sample supported by the said support and supplying a pump beam, a means of detection and/or measurement of the absorption or reflection of the pump beam by the sample when it is illuminated by the said illumination means.Finally, the invention relates to a particular application of the said device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.