Semiconductor device and test method of testing the same
US7075838B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 13, 2004 |
| Grant date | Jul 11, 2006 |
| Priority date | — |
| Expiry date | May 3, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/1802
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor device and a method of testing the semiconductor device are provided. The semiconductor device includes a memory cell array, a sense amplifier, a control circuit, a row decoder, a bitline-pair voltage setting circuit, and a wordline driver. The memory cell array is connected to one of a plurality of wordlines and a plurality of bitline pairs. The memory cell array comprises a plurality of memory cells, wherein each memory cell is connected to one of the plurality of wordlines and the plurality of bitline pairs. The sense amplifier amplifies data read from the memory cell array. The control circuit controls writing/reading of data to/from the memory cell array. The row decoder decodes an address signal and outputs a decoded signal to select one of the plurality of wordlines. The bitline-pair voltage setting circuit sets the voltage of at least one of the plurality of bitline pairs to a bitline test voltage in a test mode. The wordline driver sets the low-level voltages of the plurality of wordlines to a wordline test voltage in the test mode. The wordline test voltage level can be set to be different from the low-level voltage of the plurality of wordlines in a norma…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.