System and method for calibrating signal paths connecting a device under test to a test system
US7076385B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 23, 2004 |
| Grant date | Jul 11, 2006 |
| Priority date | — |
| Expiry date | Nov 23, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31937
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present technology involves an apparatus and method for calibrating a plurality of distinct signal paths connecting a device under test (DUT) to a time measurement device. The disclosed calibration circuit, which may be connected to the test setup throughout the testing process, measures the signal skew associated with each distinct signal path connecting a DUT, such as an integrated circuit, to a time measurement device, such as a time interval analyzer. The measured skew values, which may be collected throughout the testing process, are stored in memory. Such memory may be within the time measure device, an external storage device or a computing device that may be in communication with the time measurement device. The time measurement device uses the stored skew values to adjust the test signals to compensate for signal path related signal skew. In addition, the stored skew values are used to perform signal path diagnostics. This is accomplished by comparing newly measured skew values to stored skew values and generating a signal path failure signal when the newly measured skew values fall outside a user programmable range of acceptable skew values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.