Method and apparatus for diagnosis and behavior modification of an embedded microcontroller
US7076708B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 25, 2003 |
| Grant date | Jul 11, 2006 |
| Priority date | — |
| Expiry date | Dec 28, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318544
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of accessing an embedded microcontroller, by programmably selecting pins of the microcontroller for use as test lines, receiving a scan command at an input test line pin, emulating a virtual scan path through a logical block of the microcontroller, and transmitting scan results to an output test line pin. The microcontroller can provide such emulation of scan testing in compliance with the JTAG standard for a test access port and boundary-scan architecture. The test line pins are interconnected with a test bus structure to form a scan ring with other components of a data processing system, such as a microprocessor. The emulation can be used to change a functional mode of the microcontroller, or gather diagnostic information after a system error. The microcontroller assigns a high-priority internal interrupt routine to service test line pin activity. The virtual scan path need not include all internal microcontroller resources, and the scan path can be programmably varied by the application designer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.