Non-binary address generation for ABIST
US7076710B2 · kind B2 · utility
7Cited by
3References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 14, 2003 |
| Grant date | Jul 11, 2006 |
| Priority date | — |
| Expiry date | Jun 22, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/3602
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Method and system for testing a memory array having a non-uniform binary address space. The test system includes a test engine for generating addresses for the memory array and for generating and applying data patterns to the memory array. The test engine has an address generator including a series combination of a linear register and a binary counter for generating the non-uniform address.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.