Patent · US Expired

Deposition sensor based on differential heat flux measurement

US7077563B2 · kind B2 · utility

23Cited by
27References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 19, 2003
Grant dateJul 18, 2006
Priority date
Expiry dateNov 19, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N25/18
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus and method for the monitoring and measurement of chemical and/or biological deposition in heat exchangers and other fluid processing vessels. The new and original sensing system includes at least two hollow fluid vessels conductively mounted across a constant heat transfer path. Thin film heat flux sensors are attached to a heat transfer surface of the vessels in order to measure changes in differential heat flux that occur when deposition begins to accumulate in the vessel. In this way, it is shown that differential heat flux measurements can be used to detect and measure the early onset of chemical and/or biological deposition.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.