Ion mobility spectrometer using ion beam modulation and wavelet decomposition
US7078680B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 6, 2004 |
| Grant date | Jul 18, 2006 |
| Priority date | — |
| Expiry date | Mar 31, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/40
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The present invention is directed to a system and a method for analyzing and identifying an unknown sample using ion mobility spectrometry. The method pulses an ion gate using a temporally spaced pattern of ion admitting periods and ion repelling periods to achieve an admission duty cycle of about 50% of the total scan time. Ions passing through the drift tube strike an ion detector, generating a time dependent mobility spectrum. A combination of wavelet decomposition and statistical evaluators are used on the mobility spectrum to produce a distinct signature associated with the sample. Signatures are also generated for a number of known agents, and the known agent signatures are used to program a neural network. The sample signature is then compared to the signatures for the known agents using a fuzzy decision maker.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.