Contact probe
US7078921B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 10, 2002 |
| Grant date | Jul 18, 2006 |
| Priority date | — |
| Expiry date | Oct 10, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06738
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A contact probe comprises a tip portion for making contact with a subject surface, a supporting portion, and a spring portion for connecting the other two members. The tip portion has a corner portion whose radius of curvature is larger than that of the opposite corner portion that moves in the lead during the scrubbing by the pressing force. The insulating layer on the subject surface is sufficiently removed by the scrubbing to secure the electrical contact, and the amount of shavings is minimized during the dissociation of the contact probe. Formation of scratches on the subject surface is reduced. Another contact probe for a ball-shaped electrode has a tip portion with a recess, which has a protrusion and bottom. The protrusion breaks the insulating layer on the electrode to secure the electrical contact. The bottom makes contact with the electrode to prevent the protrusion from excessively biting the electrode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.