Method and apparatus for imaging internal structures of transparent and translucent materials
US7079254B2 · kind B2 · utility
27Cited by
10References
32Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 18, 2004 |
| Grant date | Jul 18, 2006 |
| Priority date | — |
| Expiry date | Mar 18, 2024 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B5/7257
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method for spectral interferometry comprising providing an interferometer comprising a light source and dithering an element to provide a continuous relative phase shift between target and reference arms of the interferometer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.