Semiconductor storage device formed to optimize test technique and redundancy technology
US7079432B2 · kind B2 · utility
10Cited by
19References
2Claims
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Key dates
| Filing date | Jan 20, 2005 |
| Grant date | Jul 18, 2006 |
| Priority date | — |
| Expiry date | Jan 20, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/2602
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor storage device has a function of simultaneously activating a plurality of word lines connected to the same bit line via cell transistors. The semiconductor storage device comprises a column redundancy system that sets repair regions of column redundancy based on row addresses. By the column redundancy system, the repair regions are set to cause the plurality of word lines which can be activated together to belong to the same repair region, when the repair regions are set to divide the bit line.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.