Allocation measures and metric calculations in star schema multi-dimensional data warehouse
US7080090B2 · kind B2 · utility
92Cited by
46References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 27, 2001 |
| Grant date | Jul 18, 2006 |
| Priority date | — |
| Expiry date | Apr 27, 2021 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S707/99943
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is a system, method, and apparatus for calculating metrics by using hierarchical level metadata to describe the various structures within the database. The hierarchical level metadata permit calculation of complex metrics by an analytical server which would otherwise be difficult or impossible. As a result of the way that the analytical server calculates the metrics, slicing and drilling are supported. Additionally, dimension and fact level security are also supported.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.