Patent · US Expired

Method and apparatus for measuring high speed glitch energy in an integrated circuit

US7081762B2 · kind B2 · utility

3Cited by
7References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 31, 2003
Grant dateJul 25, 2006
Priority date—
Expiry dateJul 31, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2853
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus are provided for measuring high speed glitch energy between first and second. The method and apparatus induce a change in charge on the first node from a first charge level to a second charge level with glitch energy supplied by the second node. An amount of charge is then supplied to the first node to restore the charge on the first node from the second charge level toward the first charge level. A representation of the amount of charge supplied to the first node is measured.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.