Scan capable dual edge-triggered state element for application of combinational and sequential scan test patterns
US7082560B2 · kind B2 · utility
8Cited by
5References
15Claims
0Family size
Assignee
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Key dates
| Filing date | May 23, 2003 |
| Grant date | Jul 25, 2006 |
| Priority date | — |
| Expiry date | May 5, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318541
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method of scanning a dual edge-triggered flip-flop with scan capability includes a first scan slave element capable of capturing data on a positive edge of a clock signal; and a second scan slave element capable of capturing data on a negative edge of the clock signal. An apparatus and method of scanning a dual edge-triggered flip-flop with scan capability includes a scan slave element capable of capturing data on either a positive edge or a negative edge of a clock signal; wherein a control signal determines whether the scan slave element captures data on the positive edge or negative edge of the clock signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.