Method and apparatus for predicting runway overrun
US7085630B2 · kind B2 · utility
11Cited by
7References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 29, 2005 |
| Grant date | Aug 1, 2006 |
| Priority date | — |
| Expiry date | Jul 29, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG08G5/54
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A critical point on a runway indicates a point at which an aircraft may experience a runway overrun if landing beyond the critical point. A path projection is extended from the aircraft at a descent slope angle to determine whether the aircraft will land beyond the critical point at the current descent slope. Timely alerts may be provided by accounting for the time required to announce a distance value, and the distance traveled during the announcement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.