Time measurement method using quadrature sine waves
US7085668B2 · kind B2 · utility
23Cited by
5References
25Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 20, 2004 |
| Grant date | Aug 1, 2006 |
| Priority date | — |
| Expiry date | Sep 11, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31922
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A time measurement circuit includes N time stamping units that each includes a dual sinusoid interpolator for achieving high timing resolution. The time measurement circuit is capable of time stamping input signals at a high re-trigger rate, and is thus well suited for quickly measuring the timing jitter of test signals in automatic test systems.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.