System and method for determining S-parameters of a connected structure
US7088110B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 10, 2004 |
| Grant date | Aug 8, 2006 |
| Priority date | — |
| Expiry date | Oct 7, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/32
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
One disclosed embodiment may include a method that includes providing a first set S-parameters for a path of a first substrate having a first port and a second port and providing a second set of S-parameters for a path of a second substrate having a first port and a second port. Waveform parameters are measured for an aggregate path that includes the path of the first substrate, the path of the second substrate, and a structure interconnecting the first and second substrates to provide a third set of S-parameters. A fourth set of S-parameters is calculated for the structure interconnecting the first and second substrates based on the first, second, and third sets of S-parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.