Electrochemical impedance spectroscopy system and methods for determining spatial locations of defects
US7088115B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 16, 2004 |
| Grant date | Aug 8, 2006 |
| Priority date | — |
| Expiry date | Dec 16, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/026
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for determining spatial locations of defects in a material are described. The method includes providing a plurality of electrodes in contact with a material, applying a sinusoidal voltage to a select number of the electrodes at a predetermined frequency, determining gain and phase angle measurements at other of the electrodes in response to applying the sinusoidal voltage to the select number of electrodes, determining impedance values from the gain and phase angle measurements, computing an impedance spectrum for an area of the material from the determined impedance values, and comparing the computed impedance spectrum with a known impedance spectrum to identify spatial locations of defects in the material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.