Bit-mapped image multi-stage analysis method
US7088873B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 13, 2003 |
| Grant date | Aug 8, 2006 |
| Priority date | — |
| Expiry date | Mar 3, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V30/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method is described of bit-mapped image analysis comprising division of all analysis means at one's disposal into several groups differing in accuracy and further processing multi-stage analysis.The analysis comprises a primary analysis stage and at least one profound analysis stage, with supplemental data collected at both stages.The primary analysis, includes preliminary recognition of objects with distortion and detection of objects that require more precise analysis means to overcome the distortion. At the primary analysis stage, the analysis means from the group of the most inaccurate group are used.The profound analysis stage includes repeating recognition of objects with a distortion taking into account the supplemental data obtained at the previous stage, detecting objects that require more precise analysis means to overcome the distortion, and collection of newly appeared supplemental data. Each subsequent profound analysis stage uses analysis means from the group of more accurate means.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.