Patent · US Expired

Detection of possible failure of capacitive elements in an implantable medical device

US7089057B2 · kind B2 · utility

16Cited by
44References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 26, 2002
Grant dateAug 8, 2006
Priority date
Expiry dateMay 29, 2023

Classification

  • Technology area (CPC A)Human Necessities
  • CPC primaryA61N1/36125
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

Apparatus and method for monitoring capacitive elements of an implantable medical device system for device failure and responding thereto. A therapy measurement block monitors a charge value across one or more capacitive elements. If the charge value falls outside a prescribed range, indicating possible failure in the capacitive element, the system removes from service the capacitive element and its associated regulator, notifies the implantable neuro stimulator of the failure and/or takes appropriate corrective measures.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.