Method of determining mass-to-charge ratio of ions and mass spectrometer using the method
US7091480B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Oct 7, 2004 |
| Grant date | Aug 15, 2006 |
| Priority date | — |
| Expiry date | Feb 4, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/408
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
In an analysis using a mass spectrometer having a loop orbit along which ions are made to fly a plurality of times, the present invention provides a method of determining the mass-to-charge ratio of an ion without limiting the range of the mass-to-charge ratio of the ions to be brought into the loop orbit while allowing the lapping of the orbiting ions. The measurement is carried out two or more times under different conditions (Tg=500[μs], 400[μs]) under which the number of turns of the ion concerned is different. Flight times are determined from the flight time spectrums obtained by at least two measurements. Though the numbers of turns themselves are unknown, it is possible to calculate possible mass-to-charge ratios for each flight time by incrementally setting the number of turns at plural values. The two sets of possible mass-to-charge ratios derived from the two flight time values (525[μs], 441[μs]) determined by the two measurements are compared with each other, and a value that is found in both measurement results is selected as the mass-to-charge ratio of the ion concerned. Thus, it is possible to determine the mass-to-charge ratio without limiting the range of the mass-t…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.