Method for characterization of laser pulses using pulse quality factor
US7092414B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 6, 2003 |
| Grant date | Aug 15, 2006 |
| Priority date | — |
| Expiry date | Sep 25, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J1/42
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
There is described a method of characterizing a short laser pulse, the method comprising the steps of obtaining root-mean-square widths of the pulse through second order moments of the pulse; obtaining a spectral width of the pulse using the root-mean-square widths; obtaining a root-mean square temporal width of the pulse; and defining a Pulse Quality Factor proportional to a product of the spectral width and the temporal width. This approach does not require complete characterization of laser pulses and eliminates the need of any assumption to interpret autocorrelation traces. The method can be applied to pulses of arbitrary shape.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.