Method for measuring a three-dimensional object, or assembly of objects
US7092562B2 · kind B2 · utility
3Cited by
3References
13Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | Apr 26, 2001 |
| Grant date | Aug 15, 2006 |
| Priority date | — |
| Expiry date | Jul 21, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In this system, three-dimensional objects (1, 5, 6) in an environment that may be very complex are discerned by identifying their simple contour shapes on images, and the geometric characteristics of these objects and their positions and orientations are then measured. Contours are defined by simple length, inclination, position parameters, etc. The acquired knowledge of the environment is used in each new image to refine the estimates, while introducing new object contours that have appeared, into the model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.