Patent · US Expired

Methods and apparatus for early fault detection and alert generation in a process

US7096074B2 · kind B2 · utility

31Cited by
9References
38Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 30, 2002
Grant dateAug 22, 2006
Priority date
Expiry dateAug 23, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F18/2433
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A method and apparatus for providing early fault detection and alert generation in a multi-parameter process is provided. The method comprises defining a multi-dimensional space, each dimension representing a parameter of the process; applying an analysis of the process to the space in order to define regions of high and low probability of occurrence; measuring and mapping parameter values onto the space; and generating an alert whenever a parameter value is mapped into a region of low probability. The method and apparatus are also useful for identifying the cause of faults, adjusting the process to avoid faults and predicting a process-specific maintenance schedule.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.