Patent · US Expired

Procedure for estimating a parameter of a local maxima or minima of a function

US7096132B2 · kind B2 · utility

6Cited by
12References
31Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 16, 2003
Grant dateAug 22, 2006
Priority date
Expiry dateOct 16, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04B2201/70715
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of and system for estimating a parameter of a local maxima or minima of a function. An interpolated local maxima or minima is determined. An interpolation offset is then derived, comprising a deviation between locations of the interpolated and sampled local maxima or minima of the function. An estimate of the parameter is derived from the interpolation offset.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.