System and method for testing a device
US7096141B2 · kind B2 · utility
3Cited by
3References
22Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 14, 2004 |
| Grant date | Aug 22, 2006 |
| Priority date | — |
| Expiry date | Oct 14, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In a method and system for testing a device, a tester is operable to generate a first set of test signals for testing the device. The tester is electrically coupled to a test head, which in turn provides electrical coupling to the device. A test assembly is operable to generate a second set of test signals for testing the device. The test assembly is electrically coupled to an interface apparatus, which is adapted to be removably secured to the test head. The interface apparatus is operable to communicate the first and second set of test signals to the device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.