Patent · US Expired

Method and platform for integrated physical verifications and manufacturing enhancements

US7100134B2 · kind B2 · utility

18Cited by
20References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 18, 2003
Grant dateAug 29, 2006
Priority date
Expiry dateJan 24, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/398
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An automated design for manufacturability platform which provides integrated physical verification and manufacturing enhancement operations. The platform uses an efficient data structure capable of handling and manipulating both layout circuit and geometry characteristics, which permits a wide range of operations such as timing analysis, design-rule checking and optical proximity corrections on a single platform. This feature eliminates the need to translate layout representations between various tools without the requirement of using a common database. Moreover, the platform's common user interface enables encapsulated information exchange between the design and the manufacturing teams, permiting early consideration of manufacturing distortion or enhancement impact on circuit performance.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.